Method for detecting defects in manufacturing process, involves generating variation plot for each of multiple quality attributes associated with components under production based on real-time values pertaining to each quality attribute
	GAUTAM K; SINHA R; TALUKDAR V R; GUPTA S
	2023-10-07
专利权人	MARUTI SUZUKI INDIA LTD (SUZM-C)
申请日期	2023-10-07
专利号	IN202311067399-A
成果简介	NOVELTY - The method involves generating a variation plot for each of multiple quality attributes associated with components under production based on real-time values pertaining to each quality attribute and corresponding timestamp (402). Real-time variation in the quality attribute is monitored against upper control limits and lower control limits in the variation plot (404). Potential defects in the manufacturing process are predicted based on abnormality in the monitored real time variation (406). Real time alerts are generated for the potential defects based on prediction of the potential defect in the process (408). The real- time values are obtained along with a timestamp and a component identifier. USE - Method for detecting defects in manufacturing process. ADVANTAGE - The product quality is ensured through out various manufacturing stages. Any defect within the manufacturing process may lead to decreased product efficiency and can also manufacturing costs due to wastages. By analyzing the data obtained by the inspections provide insights into behavior of the manufacturing processes. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for an apparatus to detect defects in a manufacturing process. DESCRIPTION OF DRAWING(S) - The drawing shows a flow chart of a method for detecting defects in manufacturing process. 402Step for generating a variation plot for each of multiple quality attributes associated with components under production based on real-time values pertaining to each quality attribute and corresponding timestamp 404Step for monitoring real-time variation in the quality attribute against upper control limits and lower control limits in the variation plot 406Step for predicting potential defects in the manufacturing process based on abnormality in the monitored real time variation 408Step for generating real time alerts for the potential defects based on prediction of the potential defect in the process
IPC 分类号	G06N-020/00 ; G06T-007/00 ; G16C-020/10 ; H04L-001/00 ; H04W-076/28
国家	印度
专业领域	信息技术
语种	英语
成果类型	专利
文献类型	科技成果
条目标识符	http://119.78.100.226:8889/handle/3KE4DYBR/20106
专题	中国科学院新疆生态与地理研究所
作者单位	MARUTI SUZUKI INDIA LTD (SUZM-C)
推荐引用方式 GB/T 7714	GAUTAM K,SINHA R,TALUKDAR V R,et al. Method for detecting defects in manufacturing process, involves generating variation plot for each of multiple quality attributes associated with components under production based on real-time values pertaining to each quality attribute. IN202311067399-A[P]. 2023.

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